Spatial summation of face information

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3959, Issue , 2000, Pages 451-456

  Tyler, Christopher W ^a   Chen, Chien Chung ^a  

^a SMITH KETTLEWELL EYE RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; PROBABILITY;

FACE DETECTION; FOURIER ENERGY;

FEATURE EXTRACTION;

EID: 0033692320     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)