Pockels high-voltage measurement system

IEEE Transactions on Power Delivery

Volumn 15, Issue 1, 2000, Pages 8-13

  Santos, Josemir Coelho ^b,c   Taplamacioglu, M Cengiz ^d   Hidaka, Kunihiko ^a,b  

^a IEEE

^b UNIVERSITY OF TOKYO   (Japan)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

^d GAZI UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC TRANSFORMERS; ELECTROOPTICAL EFFECTS; FIBER OPTIC SENSORS; LUMINESCENT DEVICES; OPTICAL LINKS; REFRACTIVE INDEX; TRANSDUCERS;

OPTICAL HIGH VOLTAGE MEASUREMENT TECHNIQUE; OPTICAL TRANSDUCER; OPTICAL VOLTAGE TRANSFORMER; POCKELS CRYSTAL; SUPER LUMINESCENT DIODE;

VOLTAGE MEASUREMENT;

EID: 0033692109     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/61.847221     Document Type: Article

References (10)

1. D. Kind, An Introduction to High-Voltage Experimental Technique. Braunschweig: Friedr. Vieweg & Sohn Verlagsgesellschaft mbH, 1978, pp. 3-13.
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3. T. Sawa, K. Kurosawa, T. Kaminishi, and T. Yokota, "Development of optical instrument transformers," IEEE Trans. Power Delivery, vol. 5, no. 2, pp. 884-889, Apr. 1990.
4. A. Yariv and P. Yeh, Optical Waves in Crystals, New York: John Wiley, 1984, p. 280.
5. J. C. Santos, "New optical Pockels techniques for direct measurement of high voltage," Ph.D. thesis, The University of Tokyo, Tokyo, Japan, 1996.
6. K. Hidaka, "Progress in Japan of space charge field measurement in gaseous dielectrics using a Pockels sensor," IEEE Electrical Insulation Magazine, vol. 12, no. 1, pp. 17-28, Jan./Feb. 1996.
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8. T. Seubert, P. Weiss, and J. Wildberger, "Iterative charge simulation method," in Proceedings of the Seventh International Symposium on High Voltage Engineering, Dresden, Germany, Aug. 1991, pp. 27-30.
9. J. C. Santos and K. Hidaka, "New multi-segmented Pockels device for high voltage measurement," in Proceedings of the International Conference on Electrical Engineering, Beijing, China, 1996, pp. 1366-1370.
10. M. T. Jong, Methods of Discrete Signal and System Analysis, New York: McGraw-Hill, 1982, pp. 249-375.