Microscopic detection of light-induced electron transfer in molecular assembly system using scanning Maxwell stress microscopy (SMM)

Electrochimica Acta

Volumn 45, Issue 18, 2000, Pages 2953-2959

  Hirata, Yoshiki ^a   Mizutani, Fumio ^a   Yokoyama, Hiroshi ^b  

^a NATL INST BIOSCI HUM TECHNOL   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; LANGMUIR BLODGETT FILMS; MICROSCOPIC EXAMINATION; MOLECULAR DYNAMICS;

MOLECULAR ASSEMBLY SYSTEMS; SCANNING MAXWELL STRESS MICROSCOPY;

ELECTROCHEMICAL ELECTRODES;

EID: 0033691836     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(00)00374-1     Document Type: Article

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