Wafer level optoelectronic testing for DFB laser diodes

Conference Proceedings-International Conference on Indium Phosphide and Related Materials

Volumn , Issue , 2000, Pages 435-438

  Heffner, William R ^a   Robertson, Alex ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROABSORPTION MODULATED LASERS (EML);

DISTRIBUTED FEEDBACK LASERS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; INTEGRATED OPTOELECTRONICS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING;

SEMICONDUCTOR LASERS;

EID: 0033691767     PISSN: 10928669     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICIPRM.2000.850326     Document Type: Article

References (3)

1. P. Vettiger, M. Benedict, G. Bona, P. Buchmann, E.C. Cahmn, K. Datwyler, H.P. Dietrich, A. Moser, H. Seitz, O. Voegeli, D. Webb and P. Wolf, "Full Wafer Technology-A New Approach to Large Scale Laser Fabrication and Integration" IEEE, J. Quant. El, Vol. 47, 1991, pp. 1319-30.
2. O. Voegeli, M.K. Benedict, G. Bona, P. Buchmann. N. Cahoon, K. Datwyler, H.P. Dietrich, A. Moser, G. Sasso, H.K. Seitz, P. Vettiger, D. Webb and P. Wolf, "Full Wafer Technology for large-scale laser processing and testing" J. Vac. Sci Technol. B 9, Nov./Dec. 1999, pp. 2886-92.
3. L. J. P. Ketelsen, J. A. Grenkko, S. K. Sputz, E. D. Isaacs, J. M. Vandenberg, J. E. Johnson, S. N. G. Chu, M. S. Hybertsen, K. Evans-Lutterodt, D. C. Sutryn, M. Geva, R W. Glew, C. J. Pinzone, L. S. Cheng, W. A. Asous, P. Parayenthal, R. People, M. A. Alam, and R. L. Hartman, "Wavelength stability, performance and future trends for electroabsorption-modulated sources," in Conference on Lasers and Electro-optics, San Francisco, CA, 1998, pp. 219.