Two-axis-scanning Laser Doppler vibrometer for microstructure

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4072, Issue , 2000, Pages 414-421

  Ngoi, B K A ^a   Venkatakrishnan, K ^a   Tan, B ^a   Noel, N ^a   Shen, Z W ^a   Chin, C S ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTOOPTICAL EFFECTS; DOPPLER EFFECT; LASER APPLICATIONS; LENSES; OPTICAL RESOLVING POWER; SCANNING;

LASER DOPPLER VIBROMETERS;

VIBRATION MEASUREMENT;

EID: 0033690809     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)