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Volumn 215, Issue , 2000, Pages 704-707
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Measurement system of alternating magnetic properties under DC-biased field
a
OITA UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
ESTIMATION;
FLUXMETERS;
GRAIN SIZE AND SHAPE;
MAGNETIC FLUX;
MAGNETIC HYSTERESIS;
MAGNETIZATION;
SILICON STEEL;
STEEL SHEET;
DIRECT CURRENT BIASED MAGNETIZATION;
FLUX DENSITY;
SILICON STEEL SHEET;
SINGLE SHEET TESTER;
MAGNETIC VARIABLES MEASUREMENT;
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EID: 0033690762
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(00)00264-X Document Type: Article |
Times cited : (18)
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References (2)
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