On the matching behavior of MOSFET small signal parameters

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2000, Pages 137-141

  Thewes, Roland ^a   Linnenbank, Carsten ^a   Kollmer, Ute ^a   Burges, Stefan ^a   DiLeo, Michelle ^a   Clincy, Miriam ^a   Schaper, Ulrich ^a   Brederlow, Ralf ^a   Seibert, Rudolf ^a   Weber, Werner ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CURRENT MEASUREMENT; INTEGRATED CIRCUIT LAYOUT; MOSFET DEVICES; TRANSCONDUCTANCE;

DEVICE UNDER TEST; DIFFERENTIAL DRAIN CURRENT; DRAIN CURRENT; MATCHING BEHAVIOR; SMALL SIGNAL PARAMETERS; SOURCE MONITOR UNIT;

INTEGRATED CIRCUIT TESTING;

EID: 0033690339     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)