Atomic scale characterisation of electrodeposited nanocrystalline Ni-P alloys

Materials Research Society Symposium - Proceedings

Volumn 581, Issue , 2000, Pages 517-522

  Abraham, Matthias ^a   Thuvander, Mattias ^a   Lane, Helen M ^a   Cerezo, Alfred ^a   Smith, George D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; HEAT TREATMENT; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

GRAIN BOUNDARY SEGREGATION; PROTON INDUCED X RAY EMISSION; THREE DIMENSIONAL ATOM PROBE ANALYSIS;

NICKEL ALLOYS;

EID: 0033690235     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)