Genetic algorithm based defect identification system

Expert Systems with Applications

Volumn 18, Issue 1, 2000, Pages 17-25

  Tam, S M ^a   Cheung, K C ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; KNOWLEDGE ACQUISITION; KNOWLEDGE REPRESENTATION;

DEFECT IDENTIFICATION SYSTEMS;

KNOWLEDGE BASED SYSTEMS;

EID: 0033689774     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0957-4174(99)00046-9     Document Type: Article

References (8)

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