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Volumn 216, Issue 1, 2000, Pages 304-310
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Galvanostatic deposition and characterization of cuprous oxide thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL GROWTH;
DEPOSITION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
ELECTROCHEMISTRY;
GLASS;
LIGHT ABSORPTION;
REACTION KINETICS;
REDUCTION;
THIN FILMS;
TIN COMPOUNDS;
GALVANOSTATIC DEPOSITION;
COPPER OXIDES;
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EID: 0033689422
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00416-4 Document Type: Article |
Times cited : (69)
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References (13)
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