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Volumn 216, Issue 1, 2000, Pages 304-310

Galvanostatic deposition and characterization of cuprous oxide thin films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL GROWTH; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTROCHEMISTRY; GLASS; LIGHT ABSORPTION; REACTION KINETICS; REDUCTION; THIN FILMS; TIN COMPOUNDS;

EID: 0033689422     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00416-4     Document Type: Article
Times cited : (69)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.