Lessons learned in the post-processing of field spectroradiometric data covering the 0.4 to 2.5 μm wavelength region

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4049, Issue , 2000, Pages 249-260

  Hemmer, Terrence H ^a   Westphal, Todd L ^a  

^a Spectral Information Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; INFRARED DETECTORS; INFRARED IMAGING; LIGHT REFLECTION; OPTICAL RESOLVING POWER; QUALITY CONTROL; RADIOMETERS; SEMICONDUCTOR DEVICES;

ANALYTICAL SPECTRAL DEVICES; COLLECTION PROTOCOL; DATA QUALITY;

INFRARED SPECTROMETERS;

EID: 0033687272     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.410347     Document Type: Conference Paper

References (8)