Comparison on the performance of a gamma-ray spectrometer with the variation of Pt(Au)/CdZnTe/Pt(Au) interface

Journal of Crystal Growth

Volumn 214, Issue , 2000, Pages 1111-1115

  Lee, S H ^a   Kim, I J ^a   Choi, Y J ^a   Hong, J K ^a   Lee, H K ^b   Chung, Y C ^a   Yi, Y ^b   Kim, S U ^a   Park, M J ^a  

^a Korea University   (South Korea)

^b Agency for Defence Development   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARRIER MOBILITY; CRYSTAL GROWTH; ELECTROLESS PLATING; ELECTRON TRANSPORT PROPERTIES; GAMMA RAY SPECTROMETERS; GOLD; INTERFACES (MATERIALS); PLATINUM;

CADMIUM ZINC TELLURIDE; HIGH PRESSURE BRIDGMAN;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0033686919     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00284-0     Document Type: Article

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