Silicon grisms for high resolution spectroscopy in the near infrared

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4008 (II), Issue , 2000, Pages 1383-1394

  Vitali, Fabrizio ^a   Cianci, Elena ^a   Lorenzetti, Dario ^a   Foglietti, Vittorio ^a   Notargiacomo, Andrea ^a   Giovine, Ennio ^a   Oliva, Ernesto ^a  

^a INAF OSSERVATORIO ASTRONOMICO DI ROMA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ASTRONOMY; CAMERAS; DIFFRACTION GRATINGS; INFRARED SPECTROGRAPHS; INFRARED SPECTROSCOPY; INSTRUMENT TESTING; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SILICON;

NEAR INFRARED CAMERA SPECTROGRAPH; SILICON GRISMS;

INFRARED INSTRUMENTS;

EID: 0033686266     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.395457     Document Type: Conference Paper

References (14)