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Volumn 3, Issue , 2000, Pages 561-565

Reliability control in Committee Classifier environment

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; KNOWLEDGE BASED SYSTEMS; LEARNING SYSTEMS; PATTERN RECOGNITION; RELIABILITY;

EID: 0033685666     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ijcnn.2000.861369     Document Type: Conference Paper
Times cited : (8)

References (12)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.