Ultra-low standby-currents for deep sub-micron VLSI CMOS circuits: Smart Series Switch

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 2000, Pages

  van der Meer, P R ^a   van Staveren, A ^a   van Roermund, A H M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; LOGIC CIRCUITS; SWITCHING CIRCUITS; TRANSISTORS; VLSI CIRCUITS;

SMART SERIES SWITCH METHOD;

CMOS INTEGRATED CIRCUITS;

EID: 0033684884     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2000.856067     Document Type: Conference Paper

References (5)