Evaluation of phase changes of interferograms during continuous deformations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4101, Issue , 2000, Pages

  Carlsson, Torgny E ^a   An, Wei ^a  

^a Dep of Materials Processing   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CHARGE COUPLED DEVICES; LEAST SQUARES APPROXIMATIONS; LIGHT MEASUREMENT; LIGHT SOURCES; MOIRE FRINGES; PULSED LASER APPLICATIONS; SPECKLE;

CONTINUOUS DEFORMATION; LEAST SQUARES ALGORITHMS; PHASE EVALUATION; SPECKLE INTERFEROMETRY; STRUCTURED LIGHT;

HOLOGRAPHIC INTERFEROMETRY;

EID: 0033684808     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)