Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology

Proceedings - Design Automation Conference

Volumn , Issue , 2000, Pages 239-242

  Shepard, Kenneth L ^a   Kim, Dae Jin ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; COMPUTER AIDED ANALYSIS; COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; FIELD EFFECT TRANSISTORS; LEAKAGE CURRENTS; SILICON ON INSULATOR TECHNOLOGY; THRESHOLD VOLTAGE;

PARTIALLY DEPLETED SILICON ON INSULATOR TECHNOLOGY; STATIC NOISE ANALYSIS;

SPURIOUS SIGNAL NOISE;

EID: 0033684557     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/337292.337403     Document Type: Conference Paper

References (12)