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Volumn 4082, Issue , 2000, Pages 92-98
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Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
IMAGE QUALITY;
LIGHT EMISSION;
OPTICAL MICROSCOPY;
PHOTOLUMINESCENCE;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
CONFOCAL MICROSCOPY;
OPTICAL BEAM INDUCED CURRENT;
TWO PHOTON EXCITATION;
LIGHT EMITTING DIODES;
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EID: 0033684284
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.390528 Document Type: Conference Paper |
Times cited : (4)
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References (16)
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