Optical quality of InGaAsN/GaAs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4078, Issue , 2000, Pages 18-27

  Robinson, Brad J ^a   Yuan, Lixiang ^a   Thompson, David A ^a   McMaster, Scott A ^a   Streater, Richard W ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; HOLE TRAPS; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; X RAY DIFFRACTION ANALYSIS;

GAS SOURCE MOLECULAR BEAM EPITAXY;

INTEGRATED OPTOELECTRONICS;

EID: 0033684094     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.392143     Document Type: Conference Paper

References (15)