Extraction of transistor mismatch parameters: The CMOS current-steering D/A converter as a test structure

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 2000, Pages

  Van den Bosch, A ^a   Steyaert, M ^a   Sansen, W ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL TO ANALOG CONVERSION; INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS;

CURRENT-STEERING;

CMOS INTEGRATED CIRCUITS;

EID: 0033683312     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2000.856436     Document Type: Conference Paper

References (5)