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Volumn 4000, Issue , 2000, Pages
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OPC methodology and implementation to prototyping of small SRAM cells of 0.18 μm node logic gate levels
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
FOCUSING;
LOGIC GATES;
RANDOM ACCESS STORAGE;
SEMICONDUCTOR DEVICE STRUCTURES;
DEEP ULTRAVIOLET LITHOGRAPHY;
OPTICAL PROXIMITY CORRECTION;
PHOTOLITHOGRAPHY;
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EID: 0033683266
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (5)
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