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Volumn 13, Issue 6, 2000, Pages 896-901

Transport properties of QMG fault current limiting device

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENTS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FAULT CURRENTS; LIMITERS; MAGNETIC FIELD EFFECTS; SILVER; SPUTTERING; SUPERCONDUCTIVITY; YTTRIUM BARIUM COPPER OXIDES;

EID: 0033682799     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/13/6/355     Document Type: Article
Times cited : (8)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.