Simple interface circuit to measure very small capacitance changes in capacitive sensors

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2000, Pages 406-409

  Preethichandra, D M G ^a   Shida, K ^a  

^a SAGA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CAPACITANCE MEASUREMENT; COMPUTER CONTROL; ERROR ANALYSIS;

CAPACITIVE SENSORS;

SENSORS;

EID: 0033682755     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)