Obeying Moore's Law beyond 0.18 micron

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 2000, Pages 26-31

  Borkar, Shekhar ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPACTION; DENSITY (SPECIFIC GRAVITY); DIES; ELECTRIC POWER MEASUREMENT; MAGNETIC LEAKAGE; TRANSISTORS;

MOORE'S LAW; SUPPLY VOLTAGE SCALING;

MICROPROCESSOR CHIPS;

EID: 0033682046     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)