Surface identification using angle resolved light scatter measurements

Proceedings of the International Joint Conference on Neural Networks

Volumn 6, Issue , 2000, Pages 67-72

  Rinder, T ^a   Rothe, H ^a  

^a HELMUT SCHMIDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT MEASUREMENT; LIGHT SCATTERING; OPTICAL SENSORS; PATTERN RECOGNITION; SURFACE TOPOGRAPHY;

SURFACE MICROTOPOGRAPHY;

NEURAL NETWORKS;

EID: 0033681932     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ijcnn.2000.859374     Document Type: Conference Paper

References (4)