Automatic test pattern generation for functional RTL circuits using assignment decision diagrams

Proceedings - Design Automation Conference

Volumn , Issue , 2000, Pages 43-48

  Ghosh, Indradeep ^a   Fujita, Masahiro ^a  

^a FUJITSU LABORATORIES OF AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; BOOLEAN FUNCTIONS; COMPUTER HARDWARE DESCRIPTION LANGUAGES; DATA STRUCTURES; FINITE AUTOMATA; GRAPH THEORY; LOGIC DESIGN;

ASSIGNMENT DECISION DIAGRAMS; AUTOMATIC TEST PATTERN GENERATION; FUNCTIONAL REGISTER TRANSFER LEVEL;

LOGIC CIRCUITS;

EID: 0033681620     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/337292.337309     Document Type: Conference Paper

References (13)