SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 596, Issue , 2000, Pages 301-306

Temperature dependence of the reversible and irreversible polarization contributions in ferroelectric thin films

(8) Bolten, D a Bottger U a Grossmann, M a Lohse, O a Waser, R a,b Kastner, M c Schindler, G c Dehm, C c

a RWTH AACHEN UNIVERSITY (Germany)

b FORSCHUNGSZENTRUM JÜLICH (Germany)

c INFINEON TECHNOLOGIES AG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CAPACITORS; CRYSTAL DEFECTS; FERROELECTRIC MATERIALS; FILM GROWTH; HYSTERESIS; MICROSCOPIC EXAMINATION; NUCLEATION; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; STRONTIUM COMPOUNDS; THERMAL EFFECTS;

FERROELECTRIC MEMORY DEVICES; FERROELECTRIC POLARIZATION; IRREVERSIBLE POLARIZATION; LEAD ZIRCONATE TITANATE; REVERSIBLE POLARIZATION; SIGNAL CAPACITANCE MEASUREMENT; STRONTIUM BISMUTH TANTALATE;

THIN FILMS;

EID: 0033681312 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (6)

References (10)

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