Study of single electron transistor for metrological application

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2000, Pages 593-594

  Iwasa, A ^a   Fukushima, A ^a   Sato, A ^a   Sakamoto, Y ^a   Endo, T ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; GATES (TRANSISTOR); PULSE MODULATION; SPURIOUS SIGNAL NOISE;

GATE MODULATION; SINGLE ELECTRON TUNNELING (SET) TRANSISTORS;

TRANSISTORS;

EID: 0033680667     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)