Simultaneous measurement of bulk and surface recombination lifetimes on asymmetrical silicon samples

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4076, Issue , 2000, Pages 281-288

  Sirleto, Luigi ^a   Irace, Andrea ^a   Vitale, G F ^a   Zeni, Luigi ^a   Cutolo, Antonello ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; ENERGY GAP; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; PHOTONS; SILICON WAFERS;

BULK RECOMBINATION LIFETIME; FREE CARRIER ABSORPTION; SURFACE RECOMBINATION LIFETIME; SURFACE RECOMBINATION VELOCITY;

LASER PULSES;

EID: 0033680373     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)