Directivity of the test device in EMC measurements

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2000, Pages 535-540

  Koepke, Galen ^a   Hill, David ^a   Ladbury, John ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARAMETER ESTIMATION; PATTERN RECOGNITION; RELIABILITY THEORY; STATISTICAL TESTS; TRANSMITTERS;

ANECHOIC CHAMBERS;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0033680316     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)