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Volumn 2, Issue , 2000, Pages 761-764
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Validation of an analytical large signal model for AlGaN/GaN HEMTs
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTICAL LARGE SIGNAL MODEL;
CAPACITANCE VOLTAGE BEHAVIOR;
COMPUTER SIMULATION;
CURRENT VOLTAGE CHARACTERISTICS;
SAPPHIRE;
SCATTERING PARAMETERS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM COMPOUNDS;
TRANSCONDUCTANCE;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0033678492
PISSN: 0149645X
EISSN: None
Source Type: Journal
DOI: 10.1109/MWSYM.2000.863293 Document Type: Article |
Times cited : (12)
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References (7)
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