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Volumn 2, Issue , 2000, Pages 761-764

Validation of an analytical large signal model for AlGaN/GaN HEMTs

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL LARGE SIGNAL MODEL; CAPACITANCE VOLTAGE BEHAVIOR;

EID: 0033678492     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2000.863293     Document Type: Article
Times cited : (12)

References (7)
  • 1
    • 0033314092 scopus 로고    scopus 로고
    • High Al-content AlGaN/GaN HEMTs on SiC substrates with very high power performance
    • Washington D.C., Dec
    • Y.-F. Wu, D. Kapolnek, J. Ibbetson, N.-Q. Zhang, P. Parikh, B.P. Keller, and U.K. Mishra. High Al-content AlGaN/GaN HEMTs on SiC substrates with very high power performance. In IEDM Digest? pages 925-927. Washington D.C., Dec. 1999.
    • (1999) IEDM Digest? , pp. 925-927
    • Wu, Y.-F.1    Kapolnek, D.2    Ibbetson, J.3    Zhang, N.-Q.4    Parikh, P.5    Keller, B.P.6    Mishra, U.K.7
  • 2
    • 0001737390 scopus 로고
    • A nonlinear GaAs FET model for use in the design of output circuits for power amplifiers
    • Dec
    • W.R. Curtice and M. Ettenberg. A Nonlinear GaAs FET Model for Use in the Design of Output Circuits for Power Amplifiers. IEEE Trans. Microwave Theory Tech., MTT-33:1383-1394, Dec. 1985.
    • (1985) IEEE Trans. Microwave Theory Tech. , vol.MTT-33 , pp. 1383-1394
    • Curtice, W.R.1    Ettenberg, M.2
  • 6
    • 0031146219 scopus 로고    scopus 로고
    • Low-frequency transconductance dispersion in InAlAs/InGaAs/InP HEMT's with single and double-recessed gate structures
    • W.K. Kruppa and J.B. Boos. Low-Frequency Transconductance Dispersion in InAlAs/InGaAs/InP HEMT's with Single and Double-Recessed Gate Structures. IEEE Trans. Electron Devices, 1997.
    • (1997) IEEE Trans. Electron Devices
    • Kruppa, W.K.1    Boos, J.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.