Substituted barium hexaferrite films for planar integrated phase shifters

Materials Research Society Symposium - Proceedings

Volumn 603, Issue , 2000, Pages 101-105

  Oliver, S A ^a   Yoon, S D ^b   Kozulin, I ^b   Shi, P ^b   Zuo, X ^b   Vittoria, C ^b  

^a NORTHEASTERN UNIVERSITY   (United States)

^b Northeastern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRON MICROSCOPY; FERRITES; MAGNETIC ANISOTROPY; MAGNETIC THICK FILMS; MAGNETIC VARIABLES MEASUREMENT; PULSED LASER APPLICATIONS; SAPPHIRE; SCANDIUM; SUBSTITUTION REACTIONS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

BARIUM HEXAFERRITE FILMS; MAGNETOMETRY; PULSED LASER ABLATION; TORQUE MAGNETOMETRY MEASUREMENTS;

BARIUM COMPOUNDS;

EID: 0033678037     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

1. For a review of ferrite based phase shifters, see for example, S.K. Koul and B. Bhat, Microwave and Millimeter Wave Phase Shifters, vol. 1, Artech House, Boston, 1991, pp. 315-384, and references therein.
2. H.L. Glass, Proc. IEEE 76, p. 151-158 (1988).
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4. P.C. Dorsey, D.B. Chrisey, J.S. Horwitz, P. Lubitz and R.C.Y. Auyeung, IEEE Trans. Magnetics 30, p. 4512-4517 (1994).
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8. International Center for Diffraction Data (ICDD) card numbers 39-1433 and 43-0002.