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Volumn 21, Issue 4, 2000, Pages 469-476

On the mechanism of MoSi2 pesting in the temperature range 400-500°C

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; DIFFUSION IN GASES; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; HIGH TEMPERATURE OPERATIONS; MORPHOLOGY; OXIDATION; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; THERMOGRAVIMETRIC ANALYSIS; THICKNESS MEASUREMENT; VAPORS;

EID: 0033676412     PISSN: 01966219     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.