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Volumn 45, Issue 3, 2000, Pages 235-241
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Evaluation of a divergent set of SSR markers to predict F1 grain yield performance and grain yield heterosis in maize
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
GENE FREQUENCY;
GENETIC DIFFERENCE;
HETEROSIS;
INBRED LINE;
MAIZE;
PLANT YIELD;
POLYMORPHIC LOCUS;
QUANTITATIVE TRAIT LOCUS;
SIMPLE SEQUENCE REPEAT;
UNITED STATES;
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EID: 0033675033
PISSN: 00256153
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (9)
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References (11)
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