X-ray diffraction study of Ge-Bi-Te mixed-layer ternary compounds

Inorganic Materials

Volumn 36, Issue 11, 2000, Pages 1108-1113

  Karpinskii, O G ^a   Shelimova, L E ^a   Kretova, M A ^a   Zemskov, V S ^a  

^a BAIKOV INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; GERMANIUM; TELLURIUM;

ARTICLE; CHEMICAL BOND; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; X RAY DIFFRACTION;

EID: 0033674441     PISSN: 00201685     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02758926     Document Type: Article

References (12)

1. 3-GeTe phase diagram
2. 3(GeTe)(n) (R = Sb, Bi)
3. 3)(n)GeTe
4. 6
5. 4
6. 7
7. 3 mixed layered Tetradymite-like compounds
8. AREN-85: An upgraded version of the RENTGEN crystallographic software package for NORD, SM, and ES computers
9. Structure refinement with the AREN pack
10. 3 systems
11. 4