Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC

Journal of Chemometrics

Volumn 14, Issue 4, 2000, Pages 335-349

  Westerhuis, Johan A ^a   Gurden, Stephen P ^a   Smilde, Age K ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Fault detection: process monitoring; Q statistic

Indexed keywords

BATCH DATA PROCESSING; FAULT DETECTION; MULTIVARIANT ANALYSIS; STATISTICAL PROCESS CONTROL; STATISTICS; VOLTAGE MEASUREMENT;

BATCH PROCESS; CONTINUOUS PROCESS; FAULT DETECTION: PROCESS MONITORING; FAULT-DETECTION PROCESS; LATENT VARIABLE MODELING; MULTIVARIATE STATISTICAL PROCESS CONTROL; NORMAL OPERATING CONDITIONS; OFF-LINE MONITORING; Q STATISTICS; SCALINGS;

PROCESS MONITORING;

ARTICLE; DATA ANALYSIS; MULTIVARIATE ANALYSIS; PROCESS CONTROL; STANDARDIZATION; STATISTICAL ANALYSIS; STATISTICS;

EID: 0033671795     PISSN: 08869383     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-128X(200007/08)14:4<335::AID-CEM579>3.0.CO;2-F     Document Type: Article

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