New approach to evaluate steep stress gradients principally using layer removal

Materials Science Forum

Volumn 347, Issue , 2000, Pages 80-82

  Hauk, V ^a   Krueger, B ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DIFFRACTOMETERS; STRAIN MEASUREMENT; STRESS ANALYSIS; X RAY ANALYSIS;

LATTICE PLANES; LAYER REMOVAL; STEEP STRESS GRADIENTS; TRIAXIAL RESIDUAL STRESS (RS);

RESIDUAL STRESSES;

EID: 0033671284     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (0)