Experimental examination and numerical NAG model analysis of spall sensitivity to microstructure in copper

Journal De Physique. IV : JP

Volumn 10, Issue 9, 2000, Pages 805-810

  Jacobi, S ^a,b   Zaretsky, E ^b   Shvarts, D ^a,b  

^a NUCLEAR RESEARCH CENTER NEGEV   (Israel)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

GROWTH (MATERIALS); MATHEMATICAL MODELS; METALLOGRAPHIC MICROSTRUCTURE; NUCLEATION; SPALLING;

VOIDS;

COPPER;

EID: 0033671219     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20009133     Document Type: Article

References (6)

1. Curran D.R., Seaman L. and Shockey D.A., Phys. Rep. 147 (1987), 253-388.
2. Barker L. M., Hollenbach R. E., J. Appl. Phys., 43 (11) (1972), 1669.
3. Wilkins M.L, UCRL-ID-113198, March 1993.
4. Steinberg D.J., Cochran S.G., and Guinan M.W., J. Appl. Phys., 51(3) (1980), 1498-1504.
5. Johnson J.N, J. Appl. Phys. 52(4), 1981, 2812-25.
6. S. Jacobi, E. Zaretsky, D. Shvarts, to be published.