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Volumn 185, Issue 4, 2000, Pages 275-280
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Flag leaf senescence, as evaluated by numerical image analysis, and its relationship with yield under drought in durum wheat
a a a a,b a,c,d a,c,d |
Author keywords
Drought; Durum wheat; Numerical image analysis; Senescence; Yield
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Indexed keywords
DROUGHT STRESS;
IMAGE ANALYSIS;
LEAF;
SENESCENCE;
YIELD RESPONSE;
ALGERIA;
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EID: 0033670253
PISSN: 09312250
EISSN: None
Source Type: Journal
DOI: 10.1046/j.1439-037X.2000.00436.x Document Type: Article |
Times cited : (75)
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References (25)
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