Metal surface investigation by scanning probe microscopy

Surface Engineering

Volumn 16, Issue 4, 2000, Pages 287-293

  Thornton, J T ^a  

^a East Coast Applications Lab   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

SCANNING PROBE MICROSCOPY (SPM);

SURFACE STRUCTURE;

EID: 0033666970     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708400101517224     Document Type: Article

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