Application of X-ray diffraction to thermal analysis

Journal De Physique. IV : JP

Volumn 10, Issue 10, 2000, Pages 497-504

  Engel, W ^a   Fietzek, H ^a   Herrmann, M ^a   Kolarik, V ^a  

^a Fraunhoferinstitut Chemische T   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDES; DILATOMETERS; HIGH TEMPERATURE TESTING; MOLYBDENUM COMPOUNDS; OXIDATION; PHASE TRANSITIONS; THERMOANALYSIS; X RAY DIFFRACTION ANALYSIS;

AMMONIUM NITRATE; REITVELD REFINEMENT;

AMMONIUM COMPOUNDS;

EID: 0033666610     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20001053     Document Type: Article

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