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Volumn 4090, Issue , 2000, Pages 102-107
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Recording of 0.1 micron minimum mark size in a new phase change media
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY;
OPTICAL RECORDING;
SCANNING ELECTRON MICROSCOPY;
SILICA;
SILVER ALLOYS;
STATISTICAL METHODS;
SUBSTRATES;
SURFACE STRUCTURE;
ZINC SULFIDE;
FAR FIELD OPTICAL PICKUP;
MARK LENGTH;
PHASE CHANGE MARKS;
SECONDARY ELECTRON IMAGE MODE;
UNIFORMITY;
OPTICAL DISK STORAGE;
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EID: 0033652729
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (5)
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