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Volumn 2, Issue , 2000, Pages 644-650
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Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising 'AI' evaluation techniques
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DETERIORATION;
PARTIAL DISCHARGES;
ELECTRIC BREAKDOWN;
ELECTRIC FAULT LOCATION;
LIFE CYCLE;
BEHAVIORAL MECHANISMS;
BREAKDOWN MECHANISM;
CONDITION;
ELECTRICAL BREAKDOWN;
ELECTRICAL DISCHARGES;
EXTRACT INFORMATIONS;
HIGH-VOLTAGES;
MATERIALS DEGRADATION;
NEURAL-NETWORKS;
STUDIES OF MATERIALS;
DIELECTRIC MATERIALS;
CONDITION DIAGNOSTICS;
HIGH VOLTAGE DIELECTRICS;
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EID: 0033651997
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/KES.2000.884129 Document Type: Conference Paper |
Times cited : (3)
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References (8)
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