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Volumn 6, Issue 5, 2000, Pages 249-262

Safety and risk issues in using telecare

Author keywords

[No Author keywords available]

Indexed keywords

CAREGIVER; FALLING; HOME CARE; HUMAN; INSTRUMENTATION; REVIEW; RISK ASSESSMENT; RISK MANAGEMENT; STANDARD; TELEMEDICINE;

EID: 0033647995     PISSN: 1357633X     EISSN: None     Source Type: Journal    
DOI: 10.1258/1357633001935833     Document Type: Review
Times cited : (27)

References (19)
  • 2
    • 85037476679 scopus 로고
    • Report of the Joint Workshops of the Royal College of Physicians and the British Geriatrics Society. London: Royal College of Physicians
    • Standardised Assessment Scales for Elderly People. Report of the Joint Workshops of the Royal College of Physicians and the British Geriatrics Society. London: Royal College of Physicians, 1992
    • (1992) Standardised Assessment Scales for Elderly People
  • 4
    • 0015430292 scopus 로고
    • Evaluation of a mental test score for assessment of mental impairment in the elderly
    • Hodkinson HM. Evaluation of a mental test score for assessment of mental impairment in the elderly. Age and Ageing 1972;1:233-8
    • (1972) Age and Ageing , vol.1 , pp. 233-238
    • Hodkinson, H.M.1
  • 7
    • 0003429435 scopus 로고    scopus 로고
    • London: The Stationery Office
    • Department of Health. Modernising Social Services. London: The Stationery Office, 1998
    • (1998) Modernising Social Services
  • 12
    • 85037486814 scopus 로고    scopus 로고
    • Center for Design, NC State University, Raleigh, North Carolina, USA (see http://www.design.ncsu.edu/cud/)
  • 13
    • 24344452338 scopus 로고    scopus 로고
    • Cinderalla service
    • 9-15 December
    • Thompson A. Cinderalla service. Community Care Magazine, 9-15 December 1999;1302:20-1
    • (1999) Community Care Magazine , vol.1302 , pp. 20-21
    • Thompson, A.1
  • 17
    • 2742571693 scopus 로고    scopus 로고
    • Built-in self-test in intelligent microsystems as a contributor to system quality and performance
    • Olbrich T, Bradley DA, Richardson AMD. Built-in self-test in intelligent microsystems as a contributor to system quality and performance. Quality Engineering 1996;8:601-13
    • (1996) Quality Engineering , vol.8 , pp. 601-613
    • Olbrich, T.1    Bradley, D.A.2    Richardson, A.M.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.