High numerical aperture objective lenses and optical system improved objective type total internal reflection fluorescence microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4098, Issue , 2000, Pages 142-151

  Kawano, Yoshihiro ^a   Abe, Chikara ^a   Kaneda, Toru ^a   Aono, Yasushi ^a   Abe, Katsuyuki ^a   Tamura, Keisuke ^a   Terakawa, Susumu ^a  

^a Olympus America Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; LIGHT REFLECTION; OPTICAL INSTRUMENT LENSES; OPTICAL SYSTEMS; SINGLE MODE FIBERS;

SCANNING PROBE MICROSCOPY; TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY (TIRFM);

OPTICAL MICROSCOPY;

EID: 0033645121     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.401623     Document Type: Conference Paper

References (10)