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Volumn 50, Issue 1-4, 2000, Pages 243-248
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Structural, electrical and optical characterization of semiconducting Ru2Si3
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
ENERGY GAP;
LIGHT ABSORPTION;
LIGHT EMITTING DIODES;
MOLECULAR BEAM EPITAXY;
RUTHENIUM COMPOUNDS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING SILICON;
SEMICONDUCTOR GROWTH;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
RUTHERIUM SILICIDES;
SEMICONDUCTING SILICIDES;
SEMICONDUCTING FILMS;
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EID: 0033639796
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(99)00288-9 Document Type: Article |
Times cited : (14)
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References (7)
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