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Volumn 79, Issue 1, 2000, Pages 31-35
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AlxGa1-xAs semiconductor sensor for contact pressure measurement
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CREEP TESTING;
PRESSURE MEASUREMENT;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING FILMS;
ALUMINUM GALLIUM ARSENIDE;
SEMICONDUCTOR SENSOR;
SENSORS;
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EID: 0033639664
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/S0924-4247(98)00272-6 Document Type: Article |
Times cited : (2)
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References (10)
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