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Volumn 79, Issue 1, 2000, Pages 31-35

AlxGa1-xAs semiconductor sensor for contact pressure measurement

Author keywords

[No Author keywords available]

Indexed keywords

CREEP TESTING; PRESSURE MEASUREMENT; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING FILMS;

EID: 0033639664     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00272-6     Document Type: Article
Times cited : (2)

References (10)
  • 1
    • 0026852697 scopus 로고
    • Dynamic properties of pressure sensors based on AlGaAs films
    • Zilionis S., Pyragas K., Tautvaisas G. Dynamic properties of pressure sensors based on AlGaAs films. Sensors and Actuators A. 32:1992;622-627.
    • (1992) Sensors and Actuators A , vol.32 , pp. 622-627
    • Zilionis, S.1    Pyragas, K.2    Tautvaisas, G.3
  • 2
    • 0009442926 scopus 로고
    • Semiconductor pressure sensors as seen by a physicist
    • Proc. 5th Int. Conf. High pressure in semiconductor physics, Kyoto
    • W. Trzeciakowski, E. Litwin-Staszewska, P. Perlin, Semiconductor pressure sensors as seen by a physicist, Proc. 5th Int. Conf. High pressure in semiconductor physics, Kyoto, 1992, Jpn. J. Appl. Phys., Vol. 32, Suppl. 32-1, 1993, pp. 328-333.
    • (1992) Jpn. J. Appl. Phys. , vol.32 , Issue.1-32 SUPPL. , pp. 328-333
    • Trzeciakowski, W.1    Litwin-Staszewska, E.2    Perlin, P.3
  • 6
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • Petersen K.E. Silicon as a mechanical material. Proc. IEEE. 70:1982;420.
    • (1982) Proc. IEEE , vol.70 , pp. 420
    • Petersen, K.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.