Symmetrically dependent models arising in visual assessment data

Biometrics

Volumn 56, Issue 4, 2000, Pages 1188-1191

  Viana, Marlos ^a   Olkin, Ingram ^b  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b STANFORD LAW SCHOOL   (United States)

Author keywords

Covariance structure; Multivariate normal distribution; Permutation symmetry

Indexed keywords

NORMAL DISTRIBUTION;

ACROSS TIME; COVARIANCE STRUCTURES; DEPENDENCE STRUCTURES; LATERAL CORRELATION; MAXIMUM-LIKELIHOOD ESTIMATE; MULTI-VARIATE NORMAL DISTRIBUTIONS; PERMUTATION SYMMETRY; SYMMETRICS; VISUAL ASSESSMENTS;

MAXIMUM LIKELIHOOD ESTIMATION;

ARTICLE; COVARIANCE; MAXIMUM LIKELIHOOD METHOD; MULTIVARIATE ANALYSIS; STATISTICAL ANALYSIS; STATISTICAL MODEL;

EID: 0033637983     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0006-341X.2000.01188.x     Document Type: Article

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