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Volumn 439, Issue 2-3, 2000, Pages 199-665
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[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
ION IMPLANTATION;
JUNCTION GATE FIELD EFFECT TRANSISTORS;
MOSFET DEVICES;
RADIATION DAMAGE;
READOUT SYSTEMS;
SEMICONDUCTOR DIODES;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR JUNCTIONS;
SIGNAL PROCESSING;
SILICON WAFERS;
VLSI CIRCUITS;
CHARGE COLLECTION EFFICIENCY (CCE);
EIREV;
FANO FACTORS;
OPTICAL CHARGING SPECTROSCOPY (OCS);
PIXEL DETECTORS;
POISSON SOLVER;
SEMICONDUCTOR DETECTORS;
STRIP DETECTORS;
SWITCHED CAPACITOR ARRAYS (SCA);
THERMALLY STIMULATED CURRENTS (TSC);
PARTICLE DETECTORS;
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EID: 0033633754
PISSN: 01689002
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1016/S0168-9002(99)00929-8 Document Type: Conference Review |
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Times cited : (2)
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References (8)
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