The new interfacial ubiquity of surface-enhanced raman spectroscopy

Analytical Chemistry

Volumn 72, Issue 1, 2000, Pages

  Weaver, M J ^a   Zou, S ^a   Chan, H Y H ^a,b  

^a PURDUE UNIVERSITY   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; ELECTRONICS; FILM; MATERIALS; RAMAN SPECTROMETRY; REVIEW;

ELECTROCHEMISTRY; METALS, HEAVY; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 0033627047     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (47)